# Electronic component failure times (hours) - interval frequency table
# Life test: 120 components tested to failure
# Suggested distributions: Weibull, Gamma, Log-Normal, Exponential
# Use: Fit Distributions > Grouped Data tab > upload this file (lower, upper, count format)
lower,upper,count
0,100,3
100,200,17
200,350,21
350,500,18
500,700,26
700,900,15
900,1200,16
1200,1600,4
